View GS8161Z18BT-150I_4757699.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) 18mb pipelined and flow through synchronous nbt sram 2.5 v or 3.3 v v dd 2.5 v or 3.3 v i/o commercial temp industrial temp preliminary rev: 1.00 9/2004 1/37 ? 2004, gsi technology specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. features ? user-configurable pipeline and flow through mode ? nbt (no bus turn around) functionality allows zero wait read-write-read bus utilization ? fully pin-compatible with both pipelined and flow through ntram?, nobl? and zbt? srams ? ieee 1149.1 jtag-compatible boundary scan ? 2.5 v or 3.3 v +10%/?10% core power supply ? lbo pin for linear or interleave burst mode ? pin-compatible with 2m, 4m, and 8m devices ? byte write operation (9-bit bytes) ? 3 chip enable signals for easy depth expansion ? zz pin for automatic power-down ? jedec-standard 100-lead tqfp and 165-bump fp-bga packages ? pb-free 100-lead tqfp package available functional description the gs8161z18b(t/d)/gs816 1z32b(d)/gs8161z36b(t/d) is an 18mbit synchronous static sram. gsi's nbt srams, like zbt, ntram, nobl or other pipelined read/double late write or flow through read/single late write srams, allow utilization of all available bus bandwidth by eliminating the need to insert deselect cycles when the device is switched from read to write cycles. because it is a synchronous devi ce, address, data inputs, and read/ write control inputs are captu red on the rising edge of the input clock. burst order control (lbo ) must be tied to a power rail for proper operation. asynchronous inputs include the sleep mode enable, zz and output enable. output enable can be used to override the synchronous control of the output drivers and turn the ram's out put drivers off at any time. write cycles are internally self- timed and initiated by the rising edge of the clock input. this feature eliminates complex off- chip write pulse generation required by asynchronous srams and simplifies input signal timing. the gs8161z18b(t/d)/gs8161z32b(d)/gs8161z36b(t/d) may be configured by the user to operate in pipeline or flow through mode. operating as a pipelined synchronous device, in addition to the rising-edge-tr iggered registers that capture input signals, the device incorp orates a rising -edge-triggered output register. for read cycles, pipelined sram output data is temporarily stored by the edge triggered output register during the access cycle and then released to the output drivers at the next rising edge of clock. the gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) is implemented with gsi's high performance cmos technology and is available in jedec-standard 100-pin tqfp and 165-bump fp-bga packages. parameter synopsis -250 -200 -150 unit pipeline 3-1-1-1 t kq (x18/x36) tcycle 2.5 4.0 3.0 5.0 3.8 6.7 ns ns curr (x18) curr (x32/x36) 280 330 230 270 185 210 ma ma flow through 2-1-1-1 t kq tcycle 5.5 5.5 6.5 6.5 7.5 7.5 ns ns curr (x18) curr (x32/x36) 210 240 185 205 170 190 ma ma
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 2/37 ? 2004, gsi technology gs8161z18bt pinout (package t) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 v ddq v ss dq b dq b v ss v ddq dq b dq b ft v dd nc v ss dq b dq b v ddq v ss dq b dq b dqp b v ss v ddq v ddq v ss dq a dq a v ss v ddq dq a dq a5 v ss nc v dd zz dq a dq a v ddq v ss dq a dq a v ss v ddq lbo a a a a a 1 a 0 tms tdi v ss v dd tdo tck a a a a a a a a e 1 e 2 nc nc b b b a e 3 ck w cke v dd v ss g adv a a a a a 1m x 18 top view dqp a a nc nc nc nc nc nc nc nc nc nc nc nc nc nc nc nc nc 10099989796959493929190898887868584838281 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 3/37 ? 2004, gsi technology gs8161z36bt pinout (package t) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 v ddq v ss dq c dq c v ss v ddq dq c dq c ft v dd nc v ss dq d dq d v ddq v ss dq d dq d dq d v ss v ddq v ddq v ss dq b dq b v ss v ddq dq b dq b v ss nc v dd zz dq a dq a v ddq v ss dq a dq a v ss v ddq lbo a a a a a 1 a 0 tms tdi v ss v dd tdo tck a a a a a a a a e 1 e 2 b d b c b b b a e 3 ck w cke v dd v ss g adv a a a a a 512k x 36 top view dq b dqp b dq b dq b dq b dq a dq a dq a dq a dqp a dq c dq c dq c dq d dq d dq d dqp d dq c dqp c 10099989796959493929190898887868584838281 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 4/37 ? 2004, gsi technology 100-pin tqfp pin descriptions symbol type description a 0 , a 1 in burst address inputs; preload the burst counter a in address inputs ck in clock input signal b a in byte write signal for data inputs dq a1 ?dq a9 ; active low b b in byte write signal for data inputs dq b1 ?dq b9 ; active low b c in byte write signal for data inputs dq c1 ?dq c9 ; active low b d in byte write signal for data inputs dq d1 ?dq d9 ; active low w in write enable; active low e 1 in chip enable; active low e 2 in chip enable?active high. for self decoded depth expansion e 3 in chip enable?active low. for self decoded depth expansion g in output enable; active low adv in advance/load ; burst address counter control pin cke in clock input buffer enable; active low nc ? no connect dq a i/o byte a data input and output pins dq b i/o byte b data input and output pins dq c i/o byte c data input and output pins dq d i/o byte d data input and output pins zz in power down control; active high ft in pipeline/flow through mode control; active low lbo in linear burst order; active low. tms scan test mode select
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 5/37 ? 2004, gsi technology tdi scan test data in tdo scan test data out tck scan test clock tms i scan test mode select tdi i scan test data in tdo o scan test data out tck i scan test clock v dd in core power supply v ss in ground v ddq in output driver power supply 100-pin tqfp pin descriptions symbol type description
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 6/37 ? 2004, gsi technology 165 bump bga?x18 commom i/o?top view (package d) 1234567891011 anc ae1 bb nc e3 cke adv a a aa bnc ae2ncba ck w g a anc b cncnc v ddq v ss v ss v ss v ss v ss v ddq nc dqpa c dnc dqb v ddq v dd v ss v ss v ss v dd v ddq nc dqa d enc dqb v ddq v dd v ss v ss v ss v dd v ddq nc dqa e fnc dqb v ddq v dd v ss v ss v ss v dd v ddq nc dqa f gnc dqb v ddq v dd v ss v ss v ss v dd v ddq nc dqa g hft mch nc v dd v ss v ss v ss v dd nc nc zz h j dqb nc v ddq v dd v ss v ss v ss v dd v ddq dqa nc j k dqb nc v ddq v dd v ss v ss v ss v dd v ddq dqa nc k l dqb nc v ddq v dd v ss v ss v ss v dd v ddq dqa nc l m dqb nc v ddq v dd v ss v ss v ss v dd v ddq dqa nc m n dqpb nc v ddq v ss nc nc nc v ss v ddq nc nc n pncnc a atdi a1 tdo a a anc p rlbo nc a atms a0 tck a a a ar 11 x 15 bump bga?13 mm x 15 mm body?1.0 mm bump pitch
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 7/37 ? 2004, gsi technology 165 bump bga?x32 common i/o?top view (package d) 1234567891011 anc ae1 bc bb e3 cke adv a anc a bnc ae2bd ba ck w g a anc b cncnc v ddq v ss v ss v ss v ss v ss v ddq nc nc c d dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb d e dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb e f dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb f g dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb g hft mch nc v dd v ss v ss v ss v dd nc nc zz h j dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa j k dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa k l dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa l m dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa m nncnc v ddq v ss nc nc nc v ss v ddq nc nc n pncnc a atdi a1 tdo a a anc p rlbo nc a atms a0 tck a a a ar 11 x 15 bump bga?13 mm x 15 mm body?1.0 mm bump pitch
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 8/37 ? 2004, gsi technology 165 bump bga?x36 common i/o?top view (package d) 1234567891011 anc ae1 bc bb e3 cke adv a anc a bnc ae2bd ba ck w g a anc b c dqpc nc v ddq v ss v ss v ss v ss v ss v ddq nc dqpb c d dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb d e dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb e f dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb f g dqc dqc v ddq v dd v ss v ss v ss v dd v ddq dqb dqb g hft mch nc v dd v ss v ss v ss v dd nc nc zz h j dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa j k dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa k l dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa l m dqd dqd v ddq v dd v ss v ss v ss v dd v ddq dqa dqa m n dqpd nc v ddq v ss nc nc nc v ss v ddq nc dqpa n pncnc a atdi a1 tdo a a anc p rlbo nc a atms a0 tck a a a ar 11 x 15 bump bga?13 mm x 15 mm body?1.0 mm bump pitch
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 9/37 ? 2004, gsi technology gs8161z18/32/36bd 165-bump bga pin description symbol type description a 0 , a 1 i address field lsbs and address counter preset inputs a i address inputs dq a dq b dq c dq d i/o data input and output pins b a , b b , b c , b d i byte write enable for dq a , dq b , dq c , dq d i/os; active low nc ? no connect ck i clock input signal; active high cke i clock input buffer enable; active low w i write enable; active low e 1 i chip enable; active low e 3 i chip enable; active low e 2 i chip enable; active high g i output enable; active low adv i burst address counter advance enable; active high zz i sleep mode control; active high ft i flow through or pipeline mode; active low lbo i linear burst order mode; active low tms i scan test mode select tdi i scan test data in tdo o scan test data out tck i scan test clock mch ? must connect high v dd i core power supply v ss i i/o and core ground v ddq i output driver power supply
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 10/37 ? 2004, gsi technology gs8161z18/32/36b nbt sram functional block diagram k 18 sa1 sa0 burst counter lbo adv memory array g ck cke d q ft dqa?dqn k sa1? sa0? d q match write address register 2 write address register 1 write data register 2 write data register 1 k k k k k k sense amps write drivers read, write and data coherency control logic ft a 0 ?an e 3 e 2 e 1 w b d b c b b b a
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 11/37 ? 2004, gsi technology functional details clocking deassertion of the clock enable (cke ) input blocks the clock input fr om reaching the ram's internal circuits. it may be used to suspend ram operations. failure to observ e clock enable set-up or hold requirem ents will result in erratic operation. pipeline mode read and write operations all inputs (with the exception of output enab le, linear burst order and sleep) are synchr onized to rising clock edges. single c ycle read and write operati ons must be initiated with the advance/load pin (adv) held low, in order to load the new address. device activation is accomplished by asserting al l three of the chip enable inputs (e 1 , e 2 and e 3 ). deassertion of any one of the enable inputs will deactivate the device. read operation is initiated when the following conditions are satisfied at the rising edge of clock: cke is asserted low, all three chip enables (e 1 , e 2, and e 3 ) are active, the write enable input signals w is deasserted high, and adv is asserted low. the address presented to the address inputs is latched in to address register and presented to the memory core and control logic. the contr ol logic determines that a read access is in progress and allows th e requested data to propagate to the input of the output regist er. at the next rising edge of clock the read data is allowed to propagate through the output register and onto the output pins. write operation occurs when the ram is selected, cke is asserted low, and the write input is sampled low at the rising edge of clock. the byte write enable inputs (b a , b b , b c & b d ) determine which bytes will be written. all or none may be activated. a write cycle with no byte write inputs active is a no-op cycle. the pipelined nbt sram provides double late write functionality, matching the write command versus data pipe line length (2 cycles) to the read comman d versus data pipeline length (2 cycles). a t the first rising edge of clock, enable, writ e, byte write(s), and address are registered . the data in associated with that addr ess is required at the third rising edge of clock. flow through mode read and write operations operation of the ram in flow through mode is very similar to operations in pipeline mode. activation of a read cycle and the us e of the burst address counter is identical. in flow through mode the device may begin driving out new data immediately after new address are clocked into the ram, rather than holding new data until the following (second) clock edge. therefore, in flow through mode the read pipeline is one cycle shorter than in pipeline mode. write operations are initiated in the same way, but differ in th at the write pipeline is one cy cle shorter as well, preserving the ability to turn the bus from reads to writes without inserting any dead cycles. while the pipelined nbt rams implement a double late write protocol, in flow through mode a single late write protocol mode is observed. therefore, in flow through mode, address and control are registered on the first rising edge of clock and data in is required at the data input pins at the second risin g edge of clock. function w b a b b b c b d read h x x x x write byte ?a? l l h h h write byte ?b? l h l h h write byte ?c? l h h l h write byte ?d? l h h h l write all bytes l l l l l write abort/nop l h h h h
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 12/37 ? 2004, gsi technology synchronous truth table operation type address ck cke adv w bx e 1 e 2 e 3 g zz dq notes read cycle, begin burst r external l-h l l h x l h l l l q read cycle, continue burst b next l-h l h x x x x x l l q 1,10 nop/read, begin burst r external l-h l l h x l h l h l high-z 2 dummy read, continue burst b next l-h l h x x x x x h l high-z 1,2,10 write cycle, begin burst w external l-h l l l l l h l x l d 3 write cycle, continue burst b next l-h l h x l x x x x l d 1,3,10 write abort, continue burst b next l-h l h x h x x x x l high-z 1,2,3,10 deselect cycle, power down d none l-h l l x x h x x x l high-z deselect cycle, power down d none l-h l l x x x x h x l high-z deselect cycle, power down d none l-h l l x x x l x x l high-z deselect cycle d none l-h l l l h l h l x l high-z 1 deselect cycle, continue d none l-h l h x x x x x x l high-z 1 sleep mode none x x x x x x x x x h high-z clock edge ignore, stall current l-h h x x x x x x x l - 4 notes: 1. continue burst cycles, whether read or wr ite, use the same control inputs. a deselect continue cycle can only be entered into if a dese- lect cycle is executed first. 2. dummy read and write abort can be considered nops because the sram performs no operation. a write abort occurs when the w pin is sampled low but no byte write pins are active so no writ e operation is performed. 3. g can be wired low to minimize the number of control signals provi ded to the sram. output drivers will automatically turn off du ring write cycles. 4. if cke high occurs during a pipelined r ead cycle, the dq bus will remain active (low z). if cke high occurs during a write cycle, the bus will remain in high z. 5. x = don?t care; h = logic high; l = logic low; bx = high = all byte write signals are high; bx = low = one or more byte/write signals are low 6. all inputs, except g and zz must meet setup and hold times of rising clock edge. 7. wait states can be inserted by setting cke high. 8. this device contains circuitry that ensur es all outputs are in high z during power-up. 9. a 2-bit burst counter is incorporated. 10. the address counter is incriminat ed for all burst continue cycles.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 13/37 ? 2004, gsi technology pipelined and fl ow through read write control state diagram deselect new read new write burst read burst write w r b r b w d d b b w r d b w r d d current state (n) next state (n+1) transition ? input command code key notes: 1. the hold command (cke low) is not shown because it prevents any state change. 2. w, r, b, and d represent input command codes as indicated in t he synchronous truth table. clock (ck) command current state next state ? n n+1 n+2 n+3 ??? current state and next state definition for pipelined and flow through read /write control state diagram w r
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 14/37 ? 2004, gsi technology pipeline mode data i/o state diagram intermediate intermediate intermediate intermediate intermediate intermediate high z (data in) data out (q valid) high z b w b r b d r w r w d d current state (n) next state (n+2) transition ? input command code key transition intermediate state (n+1) notes: 1. the hold command (cke low) is not shown because it prevents any state change. 2. w, r, b, and d represent input command codes as indicated in the truth tables. clock (ck) command current state intermediate ? n n+1 n+2 n+3 ??? current state and next state definition for pipeline mode data i/o state diagram next state state
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 15/37 ? 2004, gsi technology flow through mode data i/o state diagram high z (data in) data out (q valid) high z b w b r b d r w r w d d current state (n) next state (n+1) transition ? input command code key notes: 1. the hold command (cke low) is not shown because it prevents any state change. 2. w, r, b, and d represent input command codes as indicated in the truth tables. clock (ck) command current state next state ? n n+1 n+2 n+3 ??? current state and next state definition for: pipeline and flow through read write control state diagram
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 16/37 ? 2004, gsi technology burst cycles although nbt rams are designed to sustain 100% bus bandwidth by eliminating turnaround cycle when there is transition from read to write, multiple back-t o-back reads or writes may also be performed. nbt srams provide an on-chip burst address generator that can be utilized, if desired, to further simplify burst read or write implementatio ns. the adv control pin, when driven high, commands the sram to advance the internal address counter and use the c ounter generated address to read or write the sram. the starting address for the first cy cle in a burst cycle series is loaded into the sram by driving the adv pin low, into load mode. burst order the burst address counter wraps around to its initial state after four addresses (the loaded address and three more) have been accessed. the burst sequence is determined by the state of the linear burst order pin (lbo ). when this pin is low, a linear burst sequence is selected. when the ram is installed with the lbo pi n tied high, interleaved burst se quence is selected. see the tab les below for details. note: there is a pull-up device on the ft pin and a pull-down device on the zz pin, so this input pin can be unconnected and the chip will operate in the default states as specified in the above tables. burst counter sequences bpr 1999.05.18 mode pin functions mode name pin name state function burst order control lbo l linear burst h interleaved burst output register control ft l flow through h or nc pipeline power down control zz l or nc active h standby, i dd = i sb note: the burst counter wraps to initial state on the 5th clock. note: the burst counter wraps to initial state on the 5th clock. linear burst sequence a[1:0] a[1:0] a[1:0] a[1:0] 1st address 00 01 10 11 2nd address 01 10 11 00 3rd address 10 11 00 01 4th address 11 00 01 10 interleaved burst sequence a[1:0] a[1:0] a[1:0] a[1:0] 1st address 00 01 10 11 2nd address 01 00 11 10 3rd address 10 11 00 01 4th address 11 10 01 00
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 17/37 ? 2004, gsi technology sleep mode during normal operation, zz must be pulled low, either by the user or by it?s intern al pull down resistor. when zz is pulled hi gh, the sram will enter a power sleep mode after 2 cycles. at this time, internal stat e of the sram is preserved. when zz returns t o low, the sram operates normally after zz recovery time. sleep mode is a low current, power-down mode in which the device is deselected and current is reduced to i sb 2. the duration of sleep mode is dictated by the length of time the zz is in a high state. after entering sleep mode, all inputs except zz become disabled and all outputs go to high-z the zz pin is an async hronous, active high input that cau ses the device to enter sleep mo de. when the zz pin is driven high, i sb 2 is guaranteed after the time tzzi is met. because zz is an asynchronous input, pending operations or operations in progress may not be properly completed if zz is asserted. therefore, sleep mode must not be initiat ed until valid pending operations are completed. similarly, when exitin g sleep mode during tzzr, only a deselect or read commands may be applied while the sram is recovering from sleep mode. sleep mode timing diagram designing for compatibility the gsi nbt srams offer users a config urable selection between flow through mode and pipelinemode via the ft signal found on pin 14. not all vendors offer this option, however most mark pin 14 as v dd or v ddq on pipelined parts and v ss on flow through parts. gsi nbt srams are fully compatible with these sockets. tzzr tzzh tzzs tkl tkl tkh tkh tkc tkc ck zz
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 18/37 ? 2004, gsi technology note: permanent damage to the device may occur if the absolute maximum ratings are exceeded. operation should be restricted to recomm ended operating conditions. exposure to conditions exceeding the absolute maximum ra tings, for an extended period of time, may affect reliability of this component. absolute maximum ratings (all voltages reference to v ss ) symbol description value unit v dd voltage on v dd pins ? 0.5 to 4.6 v v ddq voltage in v ddq pins ? 0.5 to 4.6 v v i/o voltage on i/o pins ? 0.5 to v ddq +0.5 ( 4.6 v max.) v v in voltage on other input pins ? 0.5 to v dd +0.5 ( 4.6 v max.) v i in input current on any pin +/ ? 20 ma i out output current on any i/o pin +/ ? 20 ma p d package power dissipation 1.5 w t stg storage temperature ? 55 to 125 o c t bias temperature under bias ? 55 to 125 o c power supply voltage ranges parameter symbol min. typ. max. unit notes 3.3 v supply voltage v dd3 3.0 3.3 3.6 v 2.5 v supply voltage v dd2 2.3 2.5 2.7 v 3.3 v v ddq i/o supply voltage v ddq3 3.0 3.3 3.6 v 2.5 v v ddq i/o supply voltage v ddq2 2.3 2.5 2.7 v notes: 1. the part numbers of industrial temperatur e range versions end the character ?i?. un less otherwise noted, all performance spe cifica- tions quoted are evaluated for worst case in the temperature range marked on the device. 2. input under/overshoot voltage must be ? 2 v > vi < v ddn +2 v not to exceed 4.6 v maximum, with a pulse width not to exceed 20% tkc.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 19/37 ? 2004, gsi technology v ddq3 range logic levels parameter symbol min. typ. max. unit notes v dd input high voltage v ih 2.0 ? v dd + 0.3 v1 v dd input low voltage v il ? 0.3 ? 0.8 v 1 v ddq i/o input high voltage v ihq 2.0 ? v ddq + 0.3 v1,3 v ddq i/o input low voltage v ilq ? 0.3 ? 0.8 v 1,3 notes: 1. the part numbers of industrial temperatur e range versions end the character ?i?. un less otherwise noted, all performance spe cifica- tions quoted are evaluated for worst case in the temperature range marked on the device. 2. input under/overshoot voltage must be ? 2 v > vi < v ddn +2 v not to exceed 4.6 v maximum, with a pulse width not to exceed 20% tkc. 3. v ihq (max) is voltage on v ddq pins plus 0.3 v. v ddq2 range logic levels parameter symbol min. typ. max. unit notes v dd input high voltage v ih 0.6*v dd ? v dd + 0.3 v1 v dd input low voltage v il ? 0.3 ? 0.3*v dd v1 v ddq i/o input high voltage v ihq 0.6*v dd ? v ddq + 0.3 v1,3 v ddq i/o input low voltage v ilq ? 0.3 ? 0.3*v dd v1,3 notes: 1. the part numbers of industrial temperatur e range versions end the character ?i?. un less otherwise noted, all performance spe cifica- tions quoted are evaluated for worst case in the temperature range marked on the device. 2. input under/overshoot voltage must be ? 2 v > vi < v ddn +2 v not to exceed 4.6 v maximum, with a pulse width not to exceed 20% tkc. 3. v ihq (max) is voltage on v ddq pins plus 0.3 v. recommended operating temperatures parameter symbol min. typ. max. unit notes ambient temperature (com mercial range versions) t a 02570 c2 ambient temperature (industrial range versions) t a ? 40 25 85 c2 notes: 1. the part numbers of industrial temperatur e range versions end the character ?i?. un less otherwise noted, all performance spe cifica- tions quoted are evaluated for worst case in the temperature range marked on the device. 2. input under/overshoot voltage must be ? 2 v > vi < v ddn +2 v not to exceed 4.6 v maximum, with a pulse width not to exceed 20% tkc.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 20/37 ? 2004, gsi technology note: these parameters are sample tested. capacitance (t a = 25 o c, f = 1 mh z , v dd = 2.5 v) parameter symbol test conditions typ. max. unit input capacitance c in v in = 0 v 45pf input/output capacitance c i/o v out = 0 v 67pf ac test conditions parameter conditions input high level v dd ? 0.2 v input low level 0.2 v input slew rate 1 v/ns input reference level v dd /2 output reference level v ddq /2 output load fig. 1 notes: 1. include scope and jig capacitance. 2. test conditions as specified with output loading as shown in fig. 1 unless otherwise noted. 3. device is deselected as defined by the truth table. 50% tkc v ss ? 2.0 v 50% v ss v ih undershoot measurement and timing overshoot measurement and timing 50% tkc v dd + 2.0 v 50% v dd v il dq v ddq/2 50 ? 30pf * output load 1 * distributed test jig capacitance
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 21/37 ? 2004, gsi technology dc electrical characteristics parameter symbol test conditions min max input leakage current (except mode pins) i il v in = 0 to v dd ? 1 ua 1 ua zz input current i in1 v dd v in v ih 0 v v in v ih ? 1 ua ? 1 ua 1 ua 100 ua ft input current i in2 v dd v in v il 0 v v in v il ? 100 ua ? 1 ua 1 ua 1 ua output leakage current i ol output disable, v out = 0 to v dd ? 1 ua 1 ua output high voltage v oh2 i oh = ? 8 ma, v ddq = 2.375 v 1.7 v ? output high voltage v oh3 i oh = ? 8 ma, v ddq = 3.135 v 2.4 v ? output low voltage v ol i ol = 8 ma ? 0.4 v
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 22/37 ? 2004, gsi technology notes: 1. i dd and i ddq apply to any combination of v dd3 , v dd2 , v ddq3 , and v ddq2 operation. 2. all parameters listed are worst case scenario. operating currents parameter test conditions mode symbol -250 -200 -150 unit 0 to 70c ? 40 to 85c 0 to 70c ? 40 to 85c 0 to 70c ? 40 to 85c operating current device selected; all other inputs v ih o r v il output open (x32/ x36) pipeline i dd i ddq 290 40 300 40 240 30 250 30 190 20 200 20 ma flow through i dd i ddq 220 20 230 20 190 15 200 15 175 15 185 15 ma (x18) pipeline i dd i ddq 260 20 270 20 215 15 225 15 170 15 180 15 ma flow through i dd i ddq 200 10 210 10 175 10 185 10 160 10 170 10 ma standby current zz v dd ? 0.2 v ? pipeline i sb 40 50 40 50 40 50 ma flow through i sb 40 50 40 50 40 50 ma deselect current device deselected; all other inputs v ih or v il ? pipeline i dd 85 90 75 80 60 65 ma flow through i dd 60 65 50 55 50 55 ma
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 23/37 ? 2004, gsi technology notes: 1. these parameters are sampled and are not 100% tested. 2. zz is an asynchronous signal. however, in order to be recogniz ed on any given clock cycle, zz mu st meet the specified setup a nd hold times as specified above. ac electrical characteristics parameter symbol -250 -200 -150 unit min max min max min max pipeline clock cycle time tkc 4.0 ? 5.0 ? 6.7 ? ns clock to output valid tkq ? 2.5 ? 3.0 ? 3.8 ns clock to output invalid tkqx 1.5 ? 1.5 ? 1.5 ? ns clock to output in low-z tlz 1 1.5 ? 1.5 ? 1.5 ? ns setup time ts 1.2 ? 1.4 ? 1.5 ? ns hold time th 0.2 ? 0.4 ? 0.5 ? ns flow through clock cycle time tkc 5.5 ? 6.5 ? 7.5 ? ns clock to output valid tkq ? 5.5 ? 6.5 ? 7.5 ns clock to output invalid tkqx 2.0 ? 2.0 ? 2.0 ? ns clock to output in low-z tlz 1 2.0 ? 2.0 ? 2.0 ? ns setup time ts 1.5 ? 1.5 ? 1.5 ? ns hold time th 0.5 ? 0.5 ? 0.5 ? ns clock high time tkh 1.3 ? 1.3 ? 1.5 ? ns clock low time tkl 1.5 ? 1.5 ? 1.7 ? ns clock to output in high-z thz 1 1.5 2.5 1.5 3.0 1.5 3.0 ns g to output valid toe ? 2.5 ? 3.0 ? 3.8 ns g to output in low-z tolz 1 0 ? 0 ? 0 ? ns g to output in high-z tohz 1 ? 2.5 ? 3.0 ? 3.8 ns zz setup time tzzs 2 5 ? 5 ? 5 ? ns zz hold time tzzh 2 1 ? 1 ? 1 ? ns zz recovery tzzr 20 ? 20 ? 20 ? ns
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 24/37 ? 2004, gsi technology pipeline mode timing (nbt) write a write b write b+1 read c cont read d write e read f write g deselect d(a) d(b) d(b+1) q(c) q(d) d(e) q(f) d(g) tolz toe tohz thz tkqx tkq tlz th ts th ts th ts th ts th ts th ts th ts tkc tkl tkc tkl tkh tkh ab c defg *note: e = high(false) if e1 = 1 or e2 = 0 or e3 = 1 ck cke e * adv w bn a0?an dqa?dqd g
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 25/37 ? 2004, gsi technology flow through mode timing (nbt) jtag port operation overview the jtag port on this ram operates in a manner that is compliant with ieee standard 1149.1-1990, a serial boundary scan interface standard (commonly referred to as jtag). the jtag port input inte rface levels scale with v dd . the jtag output drivers are powered by v ddq . disabling the jtag port it is possible to use this device without utilizing the jtag port. the port is reset at power-up and will remain inactive unles s clocked. tck, tdi, and tms are designed with internal pull-up circuits.to assure normal operation of the ram with the jtag port unused, tck, tdi, and tms may be left floating or tied to either v dd or v ss . tdo should be left unconnected. write a write b write b+1 read c cont read d write e read f write g d(a) d(b) d(b+1) q(c) q(d) d(e) q(f) d(g) tolz toe tohz tkqx tkq tlz thz tkqx tkq tlz th ts th ts th ts th ts th ts th ts th ts tkc tkc tkl tkl tkh tkh ab c defg *note: e = high(false) if e1 = 1 or e2 = 0 or e3 = 1 ck cke e * adv w bn a0?an dq g
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 26/37 ? 2004, gsi technology jtag port registers overview the various jtag registers, refered to as test access port ortap registers, are select ed (one at a time) via the sequences of 1 s and 0s applied to tms as tck is strobed. each of the tap regist ers is a serial shift register that captures serial input data o n the rising edge of tck and pushes serial data out on the next falling edge of tck. when a register is selected, it is placed betwe en the tdi and tdo pins. instruction register the instruction register holds the instructi ons that are executed by the ta p controller when it is moved into the run, test/idl e, or the various data register states. instructions are 3 bits long. th e instruction register can be lo aded when it is placed betwee n the tdi and tdo pins. the instruction register is automatically preloa ded with the idcode instruction at power-up or whenever the controller is placed in test-logic-reset state. bypass register the bypass register is a single bit register that can be placed between tdi and tdo. it allows serial test data to be passed th rough the ram?s jtag port to another device in the scan chain with as little delay as possible. boundary scan register the boundary scan register is a collection of flip flops that can be preset by the logic level found on the ram?s input or i/o pins. the flip flops are then daisy chained togeth er so the levels found can be shifted seri ally out of the jtag port?s tdo pin. the boundary scan register also includes a number of place holder flip fl ops (always set to a logic 1). the relationship between t he device pins and the bits in the boundary scan register is de scribed in the scan order table following. the boundary scan register, under the control of the tap contro ller, is loaded with the contents of the rams i/o ring when the controller is in capture-dr state and then is placed between the tdi and tdo pins when the controller is moved to shift- dr state. sample-z, sample/preload and extest instructions can be us ed to activate the boundary scan register. jtag pin descriptions pin pin name i/o description tck test clock in clocks all tap events. all i nputs are captured on the rising edge of tck and all outputs propagate from the falling edge of tck. tms test mode select in the tms input is sampled on the rising edge of tck. this is the command input for the tap controller state machine. an undriven tms input wi ll produce the same result as a logic one input level. tdi test data in in the tdi input is sampled on the rising edge of tck. this is the input side of the serial registers placed between tdi and tdo. the register pl aced between tdi and tdo is determined by the state of the tap controller state machine and the instruction that is currently loaded in the tap instruction register (refer to the tap controll er state diagram). an undriven tdi pin will produce the same result as a logic one input level. tdo test data out out output that is active depending on the state of the tap state machine. output changes in response to the falling edge of tck. this is the out put side of the serial registers placed between tdi and tdo. note: this device does not have a trst (tap rese t) pin. trst is optional in ieee 1149.1. the test-logic-reset state is entered while tms is held high for five rising edges of tck. the tap cont roller is also reset automaticly at power-up.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 27/37 ? 2004, gsi technology jtag tap block diagram identification (id) register the id register is a 32-bit register that is loaded with a device and vendor specific 32-bit code when the controller is put in capture-dr state with the idcode command loaded in the instruction re gister. the code is loaded from a 32-bit on-chip rom. it describes various attributes of the ram as indicated below. the register is then placed between the tdi and tdo pins when th e controller is moved into shift- dr state. bit 0 in the register is the lsb and the first to reach tdo when shifting begins. id register contents die revision code not used i/o configuration gsi technology jedec vendor id code presence register bit # 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 x36 xxxx0000000000001000000110110011 x18 xxxx0000000000001010000110110011 instruction register id code register boundary scan register 0 1 2 0 31 30 29 1 2 0 bypass register tdi tdo tms tck test access port (tap) controller 108 1 0 control signals
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 28/37 ? 2004, gsi technology tap controller instruction set overview there are two classes of instructions defined in the standard 1149.1-1990; the standard (public) instructions, and device speci fic (private) instructions. some public instructions are mandator y for 1149.1 compliance. optional public instructions must be implemented in prescribed ways. the tap on th is device may be used to monitor all inpu t and i/o pads, and can be used to load address, data or control signals into the ram or to preload the i/o buffers. when the tap controller is placed in captur e-ir state the two least significant bits of the instruction regi ster are loaded wit h 01. when the controller is moved to the shift-ir state the instructi on register is placed between tdi and tdo. in this state the de sired instruction is serially loaded through the tdi input (while the previous contents are shifted out at tdo). for all instructions , the tap executes newly loaded instruct ions only when the controller is moved to update-ir state. the tap instruction set for this device is listed in the following table. jtag tap controller state diagram instruction descriptions bypass when the bypass instruction is loaded in the instruction register the bypass regi ster is placed between tdi and tdo. this occurs when the tap controller is moved to the shift-dr state. this allows the boa rd level scan path to be shortened to facili- tate testing of other devices in the scan path. select dr capture dr shift dr exit1 dr pause dr exit2 dr update dr select ir capture ir shift ir exit1 ir pause ir exit2 ir update ir test logic reset run test idle 0 0 1 0 1 1 0 0 1 1 1 0 0 1 1 0 0 0 0 1 1 0 0 1 10 0 0 1 11 1
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 29/37 ? 2004, gsi technology sample/preload sample/preload is a standard 1149.1 mandatory public in struction. when the sample / preload instruction is loaded in the instruction register, moving the tap controller into the capture-dr state loads the data in the rams input and i/o buffers into the boundary scan register. boundary scan regist er locations are not associated with an input or i/o pin, and are loaded with the default stat e identified in the boundary s can chain table at the end of th is section of the datasheet. beca use the ram clock is independent from the tap clock (tck) it is possible for the tap to attempt to capture the i/o ring contents while the input buffers are in transition (i.e. in a metastable state). although allowing the tap to sample metastable inputs w ill not harm the device, repeatable results cannot be expected. ram input signals must be stabilized for long enough to meet the taps input data capture set-up plus hold time (tts plus tth) . the rams clock inputs need not be paused for any other tap operation except capturing the i/o ring contents into the boundary s can register. moving the contro ller to shift-dr state then places the boundary scan register between the tdi and tdo pins. extest extest is an ieee 1149.1 mandatory public instruction. it is to be executed whenever the instru ction register is loaded with all logic 0s. the extest command does not block or override th e ram?s input pins; therefore, the ram?s internal state is still determined by its input pins. typically, the boundary scan re gister is loaded with the desired pattern of data with the sample/preload command. then the extest command is used to outp ut the boundary scan register?s contents, in parallel, on the ram?s data output drivers on the falling edge of tck when the controller is in the update-ir state. alternately, the boundary scan register may be loaded in parallel using the extest command. when the extest instruc- tion is selected, the sate of all the ram?s input and i/o pins, as well as the default values at scan register locations not as so- ciated with a pin, are transfer red in parallel into the boundary scan regist er on the rising edge of tck in the capture-dr state, the ram?s output pins drive out the value of the boundary scan register location with which each output pin is associ- ated. idcode the idcode instruction causes the id rom to be loaded into the id register when the controller is in capture-dr mode and places the id register between the tdi a nd tdo pins in shift-dr mode. the idcode instruction is the default instruction loaded in at power up and any time the controller is placed in the test-logic-reset state. sample-z if the sample-z instruction is loaded in the instruction register, all ram outputs are forced to an inactiv e drive state (high- z) and the boundary scan register is connected between tdi and t do when the tap controller is moved to the shift-dr state. rfu these instructions are reserved fo r future use. in this device they replicate the bypass instruction.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 30/37 ? 2004, gsi technology jtag tap instruction set summary instruction code description notes extest 000 places the boundary scan register between tdi and tdo. 1 idcode 001 preloads id register and places it between tdi and tdo. 1, 2 sample-z 010 captures i/o ring contents. places the b oundary scan register between tdi and tdo. forces all ram output drivers to high-z. 1 rfu 011 do not use this instruction; reserved for future use. replicates bypass instruction. places bypass register between tdi and tdo. 1 sample/ preload 100 captures i/o ring contents. places the b oundary scan register between tdi and tdo. 1 gsi 101 gsi private instruction. 1 rfu 110 do not use this instruction; reserved for future use. replicates bypass instruction. places bypass register between tdi and tdo. 1 bypass 111 places bypass regist er between tdi and tdo. 1 notes: 1. instruction codes expressed in binary, msb on left, lsb on right. 2. default instruction automatically loaded at power-up and in test-logic-reset state.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 31/37 ? 2004, gsi technology jtag port recommended operating conditions and dc characteristics parameter symbol min. max. unit notes 3.3 v test port input high voltage v ihj3 2.0 v dd3 +0.3 v1 3.3 v test port input low voltage v ilj3 ? 0.3 0.8 v 1 2.5 v test port input high voltage v ihj2 0.6 * v dd2 v dd2 +0.3 v1 2.5 v test port input low voltage v ilj2 ? 0.3 0.3 * v dd2 v1 tms, tck and tdi input leakage current i inhj ? 300 1 ua 2 tms, tck and tdi input leakage current i inlj ? 1 100 ua 3 tdo output leakage current i olj ? 11ua4 test port output high voltage v ohj 1.7 ? v5, 6 test port output low voltage v olj ? 0.4 v 5, 7 test port output cmos high v ohjc v ddq ? 100 mv ? v5, 8 test port output cmos low v oljc ? 100 mv v 5, 9 notes: 1. input under/overshoot voltage must be ? 2 v > vi < v ddn +2 v not to exceed 4.6 v maximum, with a pulse width not to exceed 20% ttkc. 2. v ilj v in v ddn 3. 0 v v in v iljn 4. output disable, v out = 0 to v ddn 5. the tdo output driver is served by the v ddq supply. 6. i ohj = ? 4 ma 7. i olj = + 4 ma 8. i ohjc = ?100 ua 9. i ohjc = +100 ua notes: 1. include scope and jig capacitance. 2. test conditions as as shown unless otherwise noted. jtag port ac test conditions parameter conditions input high level v dd ? 0.2 v input low level 0.2 v input slew rate 1 v/ns input reference level v ddq /2 output reference level v ddq /2 dq v ddq /2 50 ? 30pf * jtag port ac test load * distributed test jig capacitance
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 32/37 ? 2004, gsi technology jtag port timing diagram boundary scan (bsdl files) for information regarding the boundary scan chain, or to obta in bsdl files for this part, please contact our applications engineering department at: apps@gsitechnology.com . jtag port ac electrical characteristics parameter symbol min max unit tck cycle time ttkc 50 ? ns tck low to tdo valid ttkq ? 20 ns tck high pulse width ttkh 20 ? ns tck low pulse width ttkl 20 ? ns tdi & tms set up time tts 10 ? ns tdi & tms hold time tth 10 ? ns tth tts ttkq tth tts tth tts ttkl ttkl ttkh ttkh ttkc ttkc tck tdi tms tdo parallel sram input
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 33/37 ? 2004, gsi technology tqfp package drawing (package t) d1 d e1 e pin 1 b e c l l1 a2 a1 y notes: 1. all dimensions are in millimeters (mm). 2. package width and length do not include mold protrusion. symbol description min. nom. max a1 standoff 0.05 0.10 0.15 a2 body thickness 1.35 1.40 1.45 b lead width 0.20 0.30 0.40 c lead thickness 0.09 ? 0.20 d terminal dimension 21.9 22.0 22.1 d1 package body 19.9 20.0 20.1 e terminal dimension 15.9 16.0 16.1 e1 package body 13.9 14.0 14.1 e lead pitch ? 0.65 ? l foot length 0.45 0.60 0.75 l1 lead length ? 1.00 ? y coplanarity 0.10 lead angle 0 ? 7
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 34/37 ? 2004, gsi technology package dimensions?165-bump fp bga (package d; variation 2) a b c d e f g h j k l m n p r a b c d e f g h j k l m n p r 1 2 3 4 5 6 7 8 9 10 11 11 10 9 8 7 6 5 4 3 2 1 a1 corner top view a1 corner bottom view 1.0 1.0 10.0 1.0 1.0 14.0 130.07 150.07 a b 0.20(4x) ?0.10 ?0.25 c c a b m m ?0.44~0.64 (165x) c seating plane 0.20 c 0.36~0.46 1.40 max. 0.65 ref 0.35 c 0.26 ref
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 35/37 ? 2004, gsi technology ordering information for gs i synchronous burst rams org part number 1 type package speed 2 (mhz/ns) t a 3 status 1m x 18 gs8161z18bt-250 nbt pipeline/flow through tqfp 250/5.5 c 1m x 18 gs8161z18bt-200 nbt pipeline/flow through tqfp 200/6.5 c 1m x 18 gs8161z18bt-150 nbt pipeline/flow through tqfp 150/7.5 c 1m x 18 gs8161z18bgt-250 nbt pipeline/flow through pb-free tqfp 250/5.5 c 1m x 18 gs8161z18bgt-200 nbt pipeline/flow through pb-free tqfp 200/6.5 c 1m x 18 gs8161z18bgt-150 nbt pipeline/flow through pb-free tqfp 150/7.5 c 1m x 18 gs8161z18bd-250 nbt pipeline/fl ow through 165 bga (var.2) 250/5.5 c 1m x 18 gs8161z18bd-200 nbt pipeline/fl ow through 165 bga (var.2) 200/6.5 c 1m x 18 gs8161z18bd-150 nbt pipeline/fl ow through 165 bga (var.2) 150/7.5 c 512k x 32 gs8161z32bd-250 nbt pipeline/flow through 165 bga (var.2) 250/5.5 c 512k x 32 gs8161z32bd-200 nbt pipeline/flow through 165 bga (var.2) 200/6.5 c 512k x 32 gs8161z32bd-150 nbt pipeline/flow through 165 bga (var.2) 150/7.5 c 512k x 36 gs8161z36bt-250 nbt pipeline/flow through tqfp 250/5.5 c 512k x 36 gs8161z36bt-200 nbt pipeline/flow through tqfp 200/6.5 c 512k x 36 gs8161z36bt-150 nbt pipeline/flow through tqfp 150/7.5 c 512k x 36 gs8161z36bgt-250 nbt pipeline/flow through pb-free tqfp 250/5.5 c 512k x 36 gs8161z36bgt-200 nbt pipeline/flow through pb-free tqfp 200/6.5 c 512k x 36 gs8161z36bgt-150 nbt pipeline/flow through pb-free tqfp 150/7.5 c 512k x 36 gs8161z36bd-250 nbt pipeline/flow through 165 bga (var.2) 250/5.5 c 512k x 36 gs8161z36bd-200 nbt pipeline/flow through 165 bga (var.2) 200/6.5 c 512k x 36 gs8161z36bd-150 nbt pipeline/flow through 165 bga (var.2) 150/7.5 c 1m x 18 gs8161z18bt-250i nbt pipeline/flow through tqfp 250/5.5 i 1m x 18 gs8161z18bt-200i nbt pipeline/flow through tqfp 200/6.5 i 1m x 18 GS8161Z18BT-150I nbt pipeline/flow through tqfp 150/7.5 i 1m x 18 gs8161z18bgt-250i nbt pipeline/flow through pb-free tqfp 250/5.5 i 1m x 18 gs8161z18bgt-200i nbt pipeline/flow through pb-free tqfp 200/6.5 i 1m x 18 gs8161z18bgt-150i nbt pipeline/flow through pb-free tqfp 150/7.5 i 1m x 18 gs8161z18bd-250i nbt pipeline/fl ow through 165 bga (var.2) 250/5.5 i 1m x 18 gs8161z18bd-200i nbt pipeline/fl ow through 165 bga (var.2) 200/6.5 i notes: 1. customers requiring delivery in tape and r eel should add the character ?t? to the end of the part number. example: gs8161z18b -.150t 2. the speed column indicates the cycle frequenc y (mhz) of the device in pipeline mode and the latency (ns) in flow through mod e. each device is pipeline/flow through mode-selectable by the user. 3. t a = c = commercial temperature range. t a = i = industrial temperature range. 4. gsi offers other versions this type of device in many differ ent configurations and with a vari ety of different features, on ly some of which are covered in this data sheet. see the gs i technology web site (www.gsitechnology.com ) for a complete listing of current offerings.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 36/37 ? 2004, gsi technology 1m x 18 gs8161z18bd-150i nbt pipeline/fl ow through 165 bga (var.2) 150/7.5 i 512k x 32 gs8161z32bd-250i nbt pipeline/fl ow through 165 bga (var.2) 250/5.5 i 512k x 32 gs8161z32bd-200i nbt pipeline/fl ow through 165 bga (var.2) 200/6.5 i 512k x 32 gs8161z32bd-150i nbt pipeline/fl ow through 165 bga (var.2) 150/7.5 i 512k x 36 gs8161z36bt-250i nbt pipeline/flow through tqfp 250/5.5 i 512k x 36 gs8161z36bt-200i nbt pipeline/flow through tqfp 200/6.5 i 512k x 36 gs8161z36bt-150i nbt pipeline/flow through tqfp 150/7.5 i 512k x 36 gs8161z36bgt-250i nbt pipeline/flow through pb-free tqfp 250/5.5 i 512k x 36 gs8161z36bgt-200i nbt pipeline/flow through pb-free tqfp 200/6.5 i 512k x 36 gs8161z36bgt-150i nbt pipeline/flow through pb-free tqfp 150/7.5 i 512k x 36 gs8161z36bd-250i nbt pipeline/fl ow through 165 bga (var.2) 250/5.5 i 512k x 36 gs8161z36bd-200i nbt pipeline/fl ow through 165 bga (var.2) 200/6.5 i 512k x 36 gs8161z36bd-150i nbt pipeline/fl ow through 165 bga (var.2) 150/7.5 i ordering information for gsi sync hronous burst rams (continued) org part number 1 type package speed 2 (mhz/ns) t a 3 status notes: 1. customers requiring delivery in tape and r eel should add the character ?t? to the end of the part number. example: gs8161z18b -.150t 2. the speed column indicates the cycle frequenc y (mhz) of the device in pipeline mode and the latency (ns) in flow through mod e. each device is pipeline/flow through mode-selectable by the user. 3. t a = c = commercial temperature range. t a = i = industrial temperature range. 4. gsi offers other versions this type of device in many differ ent configurations and with a vari ety of different features, on ly some of which are covered in this data sheet. see the gs i technology web site (www.gsitechnology.com ) for a complete listing of current offerings.
gs8161z18b(t/d)/gs8161z 32b(d)/gs8161z36b(t/d) preliminary specifications cited are subject to change without notice . for latest documentation see http://www.gsitechnology.com. rev: 1.00 9/2004 37/37 ? 2004, gsi technology 18mb sync sram data sheet revision history ds/daterev. code: old; new types of changes format or content page;revisions;reason 8161zxxb_r1 ? creation of new datasheet

▲Up To Search▲

Price & Availability of GS8161Z18BT-150I

	To Download GS8161Z18BT-150I Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .